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A New Extension of the Binomial Error Model for Responses to Items of Varying Difficulty in Educational Testing and Attitude Surveys
Wiley JA,
Martin JL,
Herschkorn SJ,
Bond J
(2015)
A New Extension of the Binomial Error Model for Responses to Items of Varying Difficulty in Educational Testing and Attitude Surveys.
PLOS ONE 10(11): e0141981.
https://doi.org/10.1371/journal.pone.0141981