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Article Source: Automated Defect and Correlation Length Analysis of Block Copolymer Thin Film Nanopatterns
Murphy JN, Harris KD, Buriak JM (2015) Automated Defect and Correlation Length Analysis of Block Copolymer Thin Film Nanopatterns. PLOS ONE 10(7): e0133088. https://doi.org/10.1371/journal.pone.0133088

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