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Article Source: Serial Section Scanning Electron Microscopy (S³EM) on Silicon Wafers for Ultra-Structural Volume Imaging of Cells and Tissues
Horstmann H, Körber C, Sätzler K, Aydin D, Kuner T (2012) Serial Section Scanning Electron Microscopy (S³EM) on Silicon Wafers for Ultra-Structural Volume Imaging of Cells and Tissues. PLOS ONE 7(4): e35172. https://doi.org/10.1371/journal.pone.0035172

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