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Article Source: A low-cost concurrent TSV test architecture with lossless test output compression scheme
Lee Yw, Lim H, Seo S, Cho K, Kang S (2019) A low-cost concurrent TSV test architecture with lossless test output compression scheme. PLOS ONE 14(8): e0221043. https://doi.org/10.1371/journal.pone.0221043

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