Uncertainty-aware traction force microscopy
Fig 5
(A, D) Gaussian profile synthetic beads are randomly generated at varying signal-to-noise ratio (SNR) of image pixel noise. A uniform (U) displacement field (B, E) or a shear (S) displacement field (C, F) is applied to the synthetic beads and PIV-UQ is performed as described in ยง 2.2. In (B,C,E and F), left columns show ground-truth data consisting of applied displacement field vectors overlaid on contour maps of ensemble standard deviation ( and
). The right columns represent the same data estimated from PIV-UQ,
and
. Units are in pixels (px). (G) Joint distribution of
for uniform (U) and shear (S) deformation fields for WL of 32 and 64 px. Analysis procedure is described in Fig A in S1 Text (H) RMS of ensemble standard deviation and PIV UQ bootstrap estimates are compared for varying SNR values. (I) PIV Window size as a function of SNR with
isolines derived from data presented in (H). N = 50 realizations of
pixels images were generated.