Optimal Antiviral Switching to Minimize Resistance Risk in HIV Therapy

Open Access

Peer-reviewed

Research Article

Rutao Luo,

Affiliation Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware, United States of America
⨯
Michael J. Piovoso,

Affiliation Department of Electrical Engineering, Penn State University Great Valley, Malvern, Pennsylvania, United States of America
⨯
Javier Martinez-Picado,

Affiliations Institut de Recerca de la SIDA, IrsiCaixa, Badalona, Spain, Institució Catalana de Recerca i Estudis Avançats (ICREA), Barcelona, Spain
⨯
Ryan Zurakowski

* E-mail: ryanz@udel.edu

Affiliations Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware, United States of America, Delaware Biotechnology Institute, Newark, Delaware, United States of America
⨯

Reader Comments

the viral load would rebound shown as red-dash line in Fig. 3
http://plosone.org/article/info:doi/10.1371/journal.pone.0027047#article1.body1.sec2.sec3.sec1.p4

There is an error in the text and in the reference to Figure 3. The correct text is, "the viral load would rebound shown as a green-dashed line in Fig. 4."

No competing interests declared.

Viral load
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Medical risk factors
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Point mutation
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HIV
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Microbial mutation
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Genetics
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Antiviral therapy
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Microbial genetics
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