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Article Source: Entropy and Gravity Concepts as New Methodological Indexes to Investigate Technological Convergence: Patent Network-Based Approach
Cho Y, Kim M (2014) Entropy and Gravity Concepts as New Methodological Indexes to Investigate Technological Convergence: Patent Network-Based Approach. PLOS ONE 9(6): e98009. https://doi.org/10.1371/journal.pone.0098009

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